The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives. (a) Calculate a 95% two-sided...

stat 4a

Extracted text: The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives. (a) Calculate a 95% two-sided Cl on the fraction of defective circuits produced by this particular tool. (b) Calculate a 95% upper confidence bound on the fraction of defective circuits. Edit View Insert Format Tools Table