The article “Calibration of an FTIR Spectrometer” (P. Pankratz, Statistical Case Studies for Industrial
and Process Improvement, SIAM-ASA, 1997:19–38) describes the use of a spectrometer to make five measurements of the carbon content (in ppm) of a certain silicon wafer on each of two successive days. The results were as follows:
Day 1:
2.1321
2.1385
2.0985
2.0941
2.0680
Day 2:
2.0853
2.1476
2.0733
2.1194
2.0717
Can you conclude that the calibration of the spectrometer has changed from the first day to the second day?
Already registered? Login
Not Account? Sign up
Enter your email address to reset your password
Back to Login? Click here