Refer to Problem 3.11. The wafers are also classified by thickness of silicon coating (z = 0, low; z = 1, high). The first five imperfection counts reported for each treatment refer to z = 0 and the...

Refer to Problem 3.11. The wafers are also classified by thickness of silicon coating (z = 0, low; z = 1, high). The first five imperfection counts reported for each treatment refer to z = 0 and the last five refer to z = 1. Analyze these data, making inferences about the effects of treatment type and of thickness of coating.