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OPTICAL MICROSCOPE AND SCANNING ELECTRON MICROSCOPY (SEM)
Microscopic objects require viewing them through highly advanced instruments that implement the principle of reflection and refraction to focus all the sources of particle beams cumulatively on the object of interest. Optical microscopy and Scanning Electron Microscopy (SEM) are two such processes, which are used to conduct the function of inspection or examination of microstructures, by retracting sources of beams onto the object. However, optical microscopy differs from Scanning Electron Microscope (SEM) in the respect that it uses the rays of light to view the sample, while the SEM implements the electrons to be projected on the object of interest.
The usage of optical microscope is commonly for simple viewing of objects after they have been prepared as a sample to be kept on the observation stage. Besides, it also serves the purpose of checking the polishing of the surface of sample so that it is ready for further tests to be carried on. Thus, the details provided by an optical microscope are basic, which differs from SEM because SEM provides an intrinsic detail of even the composition and structure of the sample. It is possible with the help of the three kinds of detectors that are fitted inside an SEM— Energy Dispersive Spectrum (EDS) Detector, Back Scattered Electron Detector (BSED) and Secondary Electron Detector (SED). The function of EDS is to derive the chemical details of the composition of the sample and that of BSED is to observe the basic composition as well as structure of the prepared sample, while SED observes the structural details of the sample.
The observation of such minute structures of the sample is possible with the help of SEM Quanta 450 having an EDS Analyser. However, while viewing through the SEM, one should be mindful that the size of the sample is in accordance with that of the sample stage and can...