Data on the oxide thickness of semiconductor wafers are as follows: 425, 431, 416, 419, 421, 436, 418, 410, 431, 433, 423, 426, 410, 435, 436, 428, 411, 426, 409, 437, 422, 428, 413, 416. (a)...

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Extracted text: Data on the oxide thickness of semiconductor wafers are as follows: 425, 431, 416, 419, 421, 436, 418, 410, 431, 433, 423, 426, 410, 435, 436, 428, 411, 426, 409, 437, 422, 428, 413, 416. (a) Calculate a point estimate of the mean oxide thickness for all wafers in the population. (b) Calculate a point estimate of the standard deviation of oxide thickness for all wafers in the population. (c) Calculate the standard error of the point estimate from part (a). (d) Calculate a point estimate of the median oxide thickness for all wafers in the population. (e) Calculate a point estimate of the proportion of wafers in the population that have oxide thickness of more than 430 angstroms.