A random sample of 100 measurements of the resistance of electronic components produced in a period of 1 week was taken. The sample skewness was 0.63 and the sample kurtosis was 3.85. Test the null...

A random sample of 100 measurements of the resistance of electronic components produced in a period of 1 week was taken. The sample skewness was 0.63 and the sample kurtosis was 3.85. Test the null hypothesis that the population distribution is normal.