3. The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives. a. Calculate a 95%...

Extracted text: 3. The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives. a. Calculate a 95% two-sided Cl on the fraction of non-defective circuits produced by this particular tool. b. Calculate a 90% upper confidence bound on the fraction of defective circuits.